A comprehensive 12-month license for AZtecFlex including access the AZtecCrystal advanced, designed for an individual user to access and process their EDS, WDS and EBSD data after acquisition.
Only one license can be generated per order.
Once you have purchased your AZtecFlex licence you will receive the product key in an email notification from no-reply@estore.oxinst.com or noreply.NA.softwarelicensing@sentinelcloud.com which will also include instructions on how to activate the licence. Before activating your license, you will need to download and install the current version of AZtecFlex by copying and pasting the link below into your browser:
Please read this document for more on how to download your license.
Please note price excludes local sales taxes which will be applied at checkout.
Gold Contract Customers to release your license, please send your contract certificate to our team by clicking the link here.
AZtecFlex is a comprehensive version of AZtec designed for an individual user to access and process their data after acquisition. This personal copy of the AZtec software enables you to maximise microscope time, as data can be processed and examined at your convenience. Spectrum simulator means you can find the optime conditions for sample analysis, before you even put your sample in the microscope.
The EDS, WDS and EBSD license includes the majority of Aztec and AZtec Crystal functionality for processing EDS, WDS and EBSD data, more product details can be found here.
Details on the installation and license activation process can be found here.
By purchasing the product you will receive the following e-mails from oxford instruments:
You e-mail address will not be shared or sold to 3rd party companies for marketing purposes, but it will be provided to companies who provide licensing services for the sole purpose of order fulfilment.
The 12-month license term starts at activation, not purchase, on expiry you will no longer be able to open the Aztec software.
AZtecFlex is a 12-month personal subscription licence for installation on your desktop or laptop, designed to let you use AZtec anywhere and without needing to access shared facilities.
AZtecFlex includes advanced data processing features, for example, particle analysis and EBSD data processing, allowing you to access them even if they aren’t enabled on the system used to acquire the data. Your licence will also provide access to the latest AZtec release as soon as it is available.
Analyse data away from the lab:
Maximise collaborations by being able to open, analyse and process data that has been collected at a distant facility.
Get the latest functionality for your needs:
EDS & WDS:
EDS, WDS & EBSD:
Optimise your time:
TruMap deconvolutes overlapping peaks and removes background accounting for the elements present, to produce true elemental maps. This becomes even more important when mapping at low KeV, where the number of available peaks is limited.
This map is acquired at 3 keV and resolves sub 20 nm features. The tungsten (W) Ma peak at 1.774 keV overlaps with a silicon (Si) ka peak at 1.740 keV. Maps with a standard energy window show a W distribution which is a combination of both W and Si signals. TruMap deconvolutes the peaks to give an accurate W map. The presence of the heavy element (W) increases the background signal, even without an overlap. This can create a shadow map, as seen in the copper signal. TruMap accounts for the change in background and adjusts the map display accordingly.
AZtecCrystal is a modern, comprehensive EBSD data analysis software package designed to blend ease of use for relative newcomers to EBSD with an array of advanced tools for expert users. The software has been designed to handle the exceptionally large EBSD datasets that are now commonplace with our latest, high-speed CMOS-based EBSD detectors.
AZtecCrystal will allow you to perform all of the routine analyses that are necessary when processing EBSD datasets, including the creation of maps, analyses of crystallographic texture, examination of grain boundary properties and a comprehensive range of grain measurement tools. In addition, advanced functionality includes the calculation of elastic properties from grain orientation data, advanced phase classification / discrimination and the rapid reconstruction of parent grain microstructures in systems that have undergone displacive phase transformations.
AZtecCrystal is the ideal software for any user wishing to rapidly and effectively process and interrogate their EBSD data.
AZtecFeature is a particle analysis platform that automates the detection, morphological measurement, compositional analysis and classification of particle/granular/inclusion samples. By measuring both composition and morphological information on a particle by particle basis, AZtecFeature allows you to interpret your data in real time with powerful and easy to create classification schemes and data review plots.
All of the automatically acquired data in AZtecFeature is processed with AZtec’s Tru-Q® algorithms to ensure reliability and accuracy in the identification and quantification of elements in your samples – ensuring you get the right results each time.
AztecLayerProbe is a tool for the characterisation of layered thin film structures in the SEM. Working with layer stacks up to 2μm thick, LayerProbe is able to calculate, from an EDS analysis, layer thickness and composition. With proven accuracy across multiple critical applications including electronic devices, material coatings, energy devices and many more, LayerProbe is the ideal tool for both research and routine non-destructive analysis of layered samples – down to a nanometer scale.
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