Each pack contains 5 probes.This product is not in stock but you can order it and it will take around two weeks to get delivered.
The KNT (Kelvin Nanotechnology) scanning thermal microscopy probe is a batch fabricated AFM probe for best in class simultaneous topography and temperature/thermal conductivity mapping. The probe offers excellent flexibility and with a low spring constant Si3N4 cantilever for easy scanning and high resolution.
Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
Each pack contains 5 probes. This product is not in stock but you can pre order and it will take around two weeks to get delivered.
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
Each pack contains 5 probes. This product is not in stock but you can order and it will take around two weeks to get delivered.
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
Each pack contains 5 probes. This product is not in stock but you can order and it will take around two weeks to get delivered.
PRODUCTS
TRAINING
SUPPORT
SOFTWARE
