NCSTR AFM probes are designed for non-contact or soft tapping mode imaging.
The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge.
They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. Additionally, this probe offers a typical tip radius of curvature of less than 8 nm.
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