Non-contact / Tapping™ mode - High resonance frequency - PtIr5 NanoWorld
Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. The tip radius of curvature is less than 25 nm.