CONTSCR

804.NW.CONTSCR
Silicon probe with short cantilever for contact mode.

Each pack contains 10 probes. 
This product is not in stock but you can porder and it will take around two weeks to get delivered.
$ 310.00
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Description

f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none
Contact Mode- Short Cantilever - Reflex coating NanoWorld Pointprobe®
CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode. All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

Details

  • CONTSCR Specifications
  • Frequency (kHz):
    23.00
  • Max Frequency (kHz):
    39.00
  • Min Frequency (kHz):
    10.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.70
  • Min Spring Constant (N/m):
    0.02
  • Tip Radius (nm):
    8.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Length, Width, Thickness (µm):
    225 x 48 x 1
  • Tip Shape:
    4 sided
  • Manufacturer:
    Nanoworld

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