CONTPt

804.NW.CONTPT
Test Conductive probe with visible tip apex for electrical measurements in contact mode.

Each pack contains 10 probes. 
This product is not in stock but you can order and it will take around two weeks to get delivered.
$ 420.00
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Description

f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir
Contact Mode - PtIr5 coating
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity.

The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

The tip radius of curvature is less than 25 nm.
 

Details

  • CONTPt Specifications
  • Frequency (kHz):
    13.00
  • Max Frequency (kHz):
    17.00
  • Min Frequency (kHz):
    9.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.40
  • Min Spring Constant (N/m):
    0.07
  • Tip Radius (nm):
    25.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    Cr/PtIr
  • Reflective Coating:
    Cr/PtIr
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    4 sided
  • Manufacturer:
    Nanoworld

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