Arrow EFM

804.NW.ARROW-EFM
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
$ 407.00
Pre Order Now

Description

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir
Electrostatic Force Microscopy - PtIr5 coating
NanoWorld Arrow™ EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields very high force sensitivity, while simultaneously enabling tapping and lift mode operation. All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity.

These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm. Additionally, this probe offers a tip radius of curvature of less than 25 nm. The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Details

  • Arrow EFM Specifications
  • Frequency (kHz):
    75.00
  • Max Frequency (kHz):
    97.00
  • Min Frequency (kHz):
    58.00
  • Spring Constant (N/m):
    2.80
  • Max Spring Constant (N/m):
    5.80
  • Min Spring Constant (N/m):
    1.42
  • Tip Radius (nm):
    25.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    Cr/PtIr
  • Reflective Coating:
    Cr/PtIr
  • Length, Width, Thickness (µm):
    240 x 35 x 3
  • Tip Shape:
    3 sided
  • Manufacturer:
    Nanoworld

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