Arrow CONT

804.NW.ARROW-CONT
Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
$ 297.00
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Description

f = 14 kHz   |   k =0.2 N/m   |   tip coating: none
Contact Mode NanoWorld Arrow™ CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant. All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge.

They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm. Additionally, this probe offers a tip radius of curvature of less than 10 nm. The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Details

  • Arrow CONT Specifications
  • Frequency (kHz):
    14.00
  • Max Frequency (kHz):
    19.00
  • Min Frequency (kHz):
    10.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.38
  • Min Spring Constant (N/m):
    0.02
  • Tip Radius (nm):
    10.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Length, Width, Thickness (µm):
    450 x 45 x 2
  • Tip Shape:
    3 sided
  • Manufacturer:
    Nanoworld

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