SSS-FMR

804.NS.SSS-FMR
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
$ 818.00
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Description

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none 

SuperSharpSilicon™- Force Modulation Mode - Reflex Coating

NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • Guaranteed tip radius of curvature < 5 nm
  • Typical tip radius of curvature of 2 nm
  • Typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • Half cone angle at 200 nm from apex < 10°
  • Monolithic material
  • Highly doped to dissipate static charge
  • Chemically inert
  • High mechanical Q-factor for high sensitivity



Details

  • SSS-FMR Specifications
  • Frequency (kHz):
    75.00
  • Max Frequency (kHz):
    115.00
  • Min Frequency (kHz):
    45.00
  • Spring Constant (N/m):
    2.80
  • Max Spring Constant (N/m):
    9.50
  • Min Spring Constant (N/m):
    0.52
  • Tip Radius (nm):
    2.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Length, Width, Thickness (µm):
    225 x 30 x 2.8
  • Tip Shape:
    4 sided
  • Manufacturer:
    Nanosensors

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