SSS-FMR

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none 

SuperSharpSilicon™- Force Modulation Mode - Reflex Coating

NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

• Guaranteed tip radius of curvature < 5 nm
• Typical tip radius of curvature of 2 nm
• Typical aspect ratio at 200 nm from tip apex in the order of 4:1
• Half cone angle at 200 nm from apex < 10°
• Monolithic material
• Highly doped to dissipate static charge
• Chemically inert
• High mechanical Q-factor for high sensitivity