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PPP-XYNCHR

804.NS.PPP-XYNCHR
Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
$ 346.00
Pre Order Now
DescriptionDetails

Description

f = 330 kHz   |   k = 42 N/m   |   tip coating: none

PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

The XY-auto-alignment probes for Non-Contact / Tapping mode application (High resonance frequency) with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 125 µm short cantilevers optimized for high speed non-contact / tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8 µm is possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.

The probe offers unique features:
  • guaranteed tip radius of curvature 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • tip repositioning accuracy of better than ± 8 µm 

Details

  • PPP-XYNCHR Specifications
  • Frequency (kHz):
    330.00
  • Max Frequency (kHz):
    497.00
  • Min Frequency (kHz):
    204.00
  • Spring Constant (N/m):
    42.00
  • Max Spring Constant (N/m):
    130.00
  • Min Spring Constant (N/m):
    1,023.00
  • Tip Radius (nm):
    7.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Length, Width, Thickness (µm):
    125 x 30 x 4
  • Tip Shape:
    4 sided
  • Manufacturer:
    Nanosensors

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