PPP-RT-CONTR

804.NS.PPP-RTCONTR
Silicon probe with rotated tip and Al reflective coating for contact mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
$ 346.00
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Description

f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none
PointProbe® Plus Rotated Tip Contact Mode - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONTR type is optimized for high sensitivity due to a low force constant.

For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

Details

  • PPP-RT-CONTR Specifications
  • Frequency (kHz):
    13.00
  • Max Frequency (kHz):
    21.00
  • Min Frequency (kHz):
    6.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.75
  • Min Spring Constant (N/m):
    0.02
  • Tip Radius (nm):
    8.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Tip Shape:
    4 sided
  • Manufacturer:
    Nanosensors

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