Silicon probe with plateau tip with Al reflex coating. These probes are on the “special development” list and as such the specifications are not guaranteed and/or subject to change, pricing may fluctuate and delivery times may be longer than usual. Please contact us directly if you would like to order these probes.
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating
NANOSENSORS™ PL2-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode).
The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PL2-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm.
Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
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