PL2-CONTR

804.NS.PL2-CONTR
Silicon probe with Al reflective coating and plateau tip for contact mode. These probes are on the “special development” list and as such the specifications are not guaranteed and/or subject to change, pricing may fluctuate and delivery times may be longer than usual. Please contact us directly if you would like to order these probes. 

Each pack contains 10 probes. 

$ 890.00
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Description

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none 
PLateau Tip - Contact Mode - Reflex Coating
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever.

This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip. NANOSENSORS™ PL2-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Details

  • PL2-CONTR Specifications
  • Frequency (kHz):
    15.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.75
  • Min Spring Constant (N/m):
    0.02
  • Tip Radius (nm):
    900.00
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    Plateau
  • Manufacturer:
    Nanosensors

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