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CDT-CONTR

804.NS.CDT-CONTR
Silicon probe with conductive diamond coated tip for electrical measurements.

Each pack contains 10 probes. 
This product is not in stock but you can order and it will take around two weeks to get delivered. 
$ 1,599.00
Pre Order Now
DescriptionDetails

Description

f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond
Conductive Diamond Coated Tip - Contact Mode - Reflex Coating

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive tip we recommend this type.

Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.


Details

  • CDT-CONTR Specifications
  • Frequency (kHz):
    13.00
  • Max Frequency (kHz):
    21.00
  • Min Frequency (kHz):
    6.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.77
  • Min Spring Constant (N/m):
    0.02
  • Tip Radius (nm):
    150.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Tip Material:
    Silicon
  • Tip Coating:
    Doped Diamond
  • Reflective Coating:
    AI
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    4 sided
  • Manufacturer:
    Nanosensors

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