ATEC-CONT

804.NS.ATEC-CONT
Silicon probe with visible tip apex for contact mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
$ 445.00
Pre Order Now

Description

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none
Advanced Tip at the End of the Cantilever™ Contact Mode
NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation). Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features:
  • real tip visibility from top
  • typical tip radius of curvature better than 10 nm
  • tip height 15 - 20 µm
  • monolithic silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

     

Details

  • ATEC-CONT Specifications
  • Frequency (kHz):
    15.00
  • Max Frequency (kHz):
    25.00
  • Min Frequency (kHz):
    7.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.75
  • Min Spring Constant (N/m):
    0.02
  • Tip Radius (nm):
    10.00
  • Tip Height (um):
    17.50
  • Max Tip Height (um):
    20.00
  • Min Tip Height (um):
    15.00
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    3 sided
  • Manufacturer:
    Nanosensors

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