This product is a direct replacement to the discontinued OLYMPUS AC160TS-R3
Tapping / Non-Contact - Silicon Probe with visible apex tip. Each pack contains 10 probes.
Tapping / Non-Contact - Silicon Probe with Al reflex coating. Each pack contains 10 probes.
Pre-mounted on carriers for use with Jupiter Discovery AFMs. Ideal for general tapping modes. Each Pack contains 20 pre-mounted probes.
Pre-mounted on carriers for use with Jupiter Discovery AFMs. Ideal for general soft tapping and FFM-Topography modes. Each pack contains 20 pre-mounted probes.
Tapping / Non-Contact / Force Modulation - Silicon Probe with Al reflex coating. Each pack contains 10 probes.
New and improved Oxford exclusive probe coated with high coercivity material for Magnetic Force Microscopy (MFM) measurements of challenging materials. Each pack contains 10 probes.
Silicon probe with visible tip apex and magnetic coating for standard MFM applications. Each pack contains 10 probes.
Silicon probe with visible tip apex and magnetic coating for high moment MFM applications. Each pack contains 10 probes.
Magnetically coated visible tip apex silicon probe for low coercivity MFM measurement. 75 kHz. 2.8 N/m. Each pack contains 10 probes.
Silicon probe with visible tip apex and magnetic coating for low moment MFM applications.
Each pack contains 10 probes.
NOTICE: OLYMPUS Corp. announced discontinuation of this product in September 2022. This product has been directly replaced with the TITAN 300 Al. You will receive 2 free TITAN 300 Al AFM Probes when you purchase this pack of 10 AFM Cantilevers..

NOTICE: OLYMPUS Corp. announced discontinuation of this product in September 2022. This product has been directly replaced with the TITAN 300 Au. You will receive 2 free TITAN 300 Au AFM Probes when you purchase this pack of 10 AFM Cantilevers.

Tapping / Non-Contact - Silicon AFM Probe with Al reflex coating. Each pack contains 10 probes.
Tapping / Non-Contact - Silicon AFM Probe with Al reflex coating. Each pack contains 10 probes.
Tapping / Non-Contact - Silicon AFM Probe with Au reflex coating. Each pack contains 10 probes.
High Aspect Ratio - Tapping / Non-Contact Silicon Probe with Au reflex coating. Each pack contains 10 probes.
Tapping / Non-Contact - Silicon AFM Probe with Al reflex coating. Each pack contains 10 probes.
Force modulation probe with a polycrystalline diamond coating doped with boron for topography and electrical measurements with high tip durability. Each pack contains 10 probes
Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability. Each pack contains 10 probes
Tapping / Non-Contact - Silicon AFM Probe with Al reflex coating. Each pack contains 10 probes.
Tapping / Non-Contact - Silicon Probe with Al reflex coating. Each pack contains 10 probes
Tapping / Non-Contact - Silicon AFM Probe with Au gold reflex coating. Each pack contains 10 probes.
Conductive AFM - Silicon Probe with Pt tip side and reflex coating. Each pack contains 10 probes
High Aspect Ratio - Tapping / Non-Contact silicon Probe with Au reflex coating.
Each pack contains 10 probes.
High Aspect Ratio - Tapping / Non-Contact Silicon Probe with Al reflex coating. Each pack contains 10 probes
Tapping / Non-Contact / Force Modulation - Silicon Probe with Al reflex coating. Each pack contains 10 probes.
High Aspect Ratio - Tapping / Non-Contact Silicon Probe with Au reflex coating
Each pack contains 10 probes.
Conductive AFM - Silicon Probe with Pt tip side and reflex coating.
Each pack contains 10 probes
Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability. Each pack contains 10 probes