KNT-STHM

812.KNT.STHM
Each pack contains 5 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.

The KNT (Kelvin Nanotechnology) scanning thermal microscopy probe is a batch fabricated AFM probe for best in class simultaneous topography and temperature/thermal conductivity mapping. The probe offers excellent flexibility and with a low spring constant Si3N4 cantilever for easy scanning and high resolution.
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£ 1,592.00
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Description

The KNT (Kelvin Nanotechnology) scanning thermal microscopy probe is a batch fabricated AFM probe for best in class simultaneous topography and temperature/thermal conductivity mapping. The probe offers excellent flexibility and with a low spring constant Si3N4 cantilever for easy scanning and high resolution.

Sub 100 nm topographic and thermal spatial resolution is readily achieved, with a temperature resolution of 0.1 K.

KNT have been fabricating scanning thermal microscopy probes used by industry and academia for over fifteen years. The KNT-SThM-2an delivers improved mechanical stability and operation over an extended temperature range.

Details

  • KNT-STHM Specifications
  • Max Frequency (kHz):
    205.0
  • Spring Constant (N/m):
    0.4
  • Max Spring Constant (N/m):
    0.4
  • Tip Radius (nm):
    10.0
  • Tip Height (um):
    12.5
  • Max Tip Height (um):
    10.0
  • Tip Shape:
    Customer
  • Tip Coating:
    5nm of NiCr and 40nm Pd
  • Manufacturer:
    Kelvin Nanotechnology

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