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12.5mm dia cylinder stub converter for JEOL product photo
12.5mm dia cylinder stub converter for JEOL

12.5mm dia cylinder stub adaptor / converter for JEOL, they accommodate the standard pin type stub format of the European and USA manufacturers.

ID 51-1625-0282
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£ 12.98
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Aluminium pin stubs, 12.5mm dia (100 Pack) product photo
Aluminium pin stubs, 12.5mm dia (100 Pack)

Aluminium pin stubs that come in a pack of 100. 12.5mm dia, pin length 8mm, pin diameter 3.2mm.

ID 51-1625-0139
£ 26.10
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JEOL stubs, aluminium (50 Pack) product photo
JEOL stubs, aluminium (50 Pack)

JEOL stubs, aluminium supplied in a pack of 50

ID 51-1625-0050
£ 18.95
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PELCO® Q Pin Stubs (12.7 x 12.7mm) product photo
PELCO® Q Pin Stubs (12.7 x 12.7mm)

New Scanning Electron Microscopy Pin Stubs by PELCO. These new fundamentally improved pin stubs are for correlative, corroborative and repetitive microscopy and repetitive SEM imaging/analysis and specimen preparation. Choose your size from the dropdown menu. 12.7 x 12.7mm (1/2" x 1/2")

ID 51-1625-0912
  • Buy 3 products & receive 30% off!
    Add 3 included products from the offer category your basket to apply automatic discount. Product exclusions may apply. Maximum discount value £300. Excludes Items on pre-order.

     

£ 11.66
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PELCO® Q Pin Stubs (19 x 19mm) product photo
PELCO® Q Pin Stubs (19 x 19mm)

New Scanning Electron Microscopy Pin Stubs by PELCO. These new fundamentally improved pin stubs are for correlative, corroborative and repetitive microscopy and repetitive SEM imaging/analysis and specimen preparation. Choose your size from the dropdown menu. 19 x 19mm (3/4" x 3/4")

ID 51-1625-0924
£ 16.71
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Sample Pin Stubs (10 Pack) product photo
Sample Pin Stubs (10 Pack)
Pre-tilt single sample holder 21mm. EBSD sample stub XL20
ID 51-1120-465
£ 39.00
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SEM Metallurgical Mount Sample Holder product photo
SEM Metallurgical Mount Sample Holder

These holders with pin stub mounts accept standard metallurgical mounts.
(1.25 inch diameter). Available for microscopes using other mounts on request. Choose the size you require from the dropdown menu:

ID 51-1625-0763
£ 92.96
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SEM Specimen Stub, 12.5mm dia, carbon product photo
SEM Specimen Stub, 12.5mm dia, carbon

SEM Specimen Stub for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon

ID 51-1625-0091
£ 6.50
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SEM Specimen Stubs, 10mm dia, 5mm high (50 Pack) product photo
SEM Specimen Stubs, 10mm dia, 5mm high (50 Pack)

SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage

ID 51-1625-0426
£ 15.93
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SEM Specimen Stubs, 12.5mm dia, 10mm high (Pack of 50) product photo
SEM Specimen Stubs, 12.5mm dia, 10mm high (Pack of 50)
SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.
ID 51-1625-0263
£ 17.18
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SEM Specimen Stubs, 12.5mm dia, 20° chamfer product photo
SEM Specimen Stubs, 12.5mm dia, 20° chamfer

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium. (10 pack)

ID 51-1625-0425
£ 19.89
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SEM Specimen Stubs, 12.5mm dia, 45° chamfer (10 Pack) product photo
SEM Specimen Stubs, 12.5mm dia, 45° chamfer (10 Pack)

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

ID 51-1625-0140
£ 16.34
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SEM Specimen Stubs, 12.7mm dia, 36° chamfer, 6mm pin, low profile product photo
SEM Specimen Stubs, 12.7mm dia, 36° chamfer, 6mm pin, low profile

These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.

ID 51-1625-0976
£ 52.14
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SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profile product photo
SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profile

These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.

 

ID 51-1625-0981
£ 58.93
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SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer product photo
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.

ID 51-1625-0269
£ 5.86
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SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profile (10 Pack) product photo
SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profile (10 Pack)

A pack of 10 low profile aluminium flat pin stubs which accommodate specimens with small working distances in FIB applications.

ID 51-1625-0945
£ 32.98
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SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low profile product photo
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low profile

These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.

ID 51-1625-0962
£ 41.86
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SEM Specimen Stubs, 12.7mm dia, low profile (10 Pack) product photo
SEM Specimen Stubs, 12.7mm dia, low profile (10 Pack)

A pack of 10 low profile aluminium flat pin stubs which accommodate specimens with small working distances in FIB applications.

ID 51-1625-0960
£ 41.50
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SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin (50 Pack) product photo
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin (50 Pack)
SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium.
ID 51-1625-0273
£ 72.38
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SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin product photo
SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
ID 51-1625-0805
£ 13.86
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SEM Specimen Stubs 12.5mm dia, 3.2x8mm pin no groove (100 Pack) product photo
SEM Specimen Stubs 12.5mm dia, 3.2x8mm pin no groove (100 Pack)
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
ID 51-1625-0256
£ 28.10
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SEM Specimen Stubs Aluminium 12.5mm dia 3.2 x 6mm pin (100 Pack) product photo
SEM Specimen Stubs Aluminium 12.5mm dia 3.2 x 6mm pin (100 Pack)

SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm. Aluminium.

ID 51-1625-0199
£ 29.81
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SEM Specimen Stubs for Hitachi, M4 thread (50 Pack) product photo
SEM Specimen Stubs for Hitachi, M4 thread (50 Pack)

SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high with M4 thread. Made from Aluminium. Choose your size from the dropdown menu.

ID 51-1625-0272
£ 69.74
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SEM Specimen Stub with Al core carbon Tab & Tube product photo
SEM Specimen Stub with Al core carbon Tab & Tube

SEM Specimen Stub with Al core carbon Tab & Tube supplied in a pack of 10.

ID 51-1625-1366
£ 25.14
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SEM Stub (pin format) for TEM Grids product photo
SEM Stub (pin format) for TEM Grids
SEM Stub (pin format) for TEM Grids which allows four TEM grids to be securely held for SEM work.
ID 51-1625-0196
£ 64.59
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SEM Stub Freeze Dry Holder product photo
SEM Stub Freeze Dry Holder
A simple holder for five 12.5mm pin type stubs.
ID 51-1625-0466
£ 46.72
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Serialised SEM Specimen Stubs product photo
Serialised SEM Specimen Stubs

Laser etched serialised standard 12.5mm dia aluminium pin stubs with pre-mounted carbon tabs, suitable for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.

ID 51-1625-0811
£ 89.69
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Slotted specimen stub 12.5mm (Single) product photo
Slotted specimen stub 12.5mm (Single)

12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination.(Sold as singles)

ID 51-1625-0031
£ 8.78
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