12.5mm dia cylinder stub adaptor / converter for JEOL, they accommodate the standard pin type stub format of the European and USA manufacturers.
Buy 3 products & receive 30% off!
Add 3 included products from the offer category your basket to apply automatic discount. Product exclusions may apply. Maximum discount value £300. Excludes Items on pre-order.
Aluminium pin stubs that come in a pack of 100. 12.5mm dia, pin length 8mm, pin diameter 3.2mm.
New Scanning Electron Microscopy Pin Stubs by PELCO. These new fundamentally improved pin stubs are for correlative, corroborative and repetitive microscopy and repetitive SEM imaging/analysis and specimen preparation. Choose your size from the dropdown menu. 12.7 x 12.7mm (1/2" x 1/2")
Buy 3 products & receive 30% off!
Add 3 included products from the offer category your basket to apply automatic discount. Product exclusions may apply. Maximum discount value £300. Excludes Items on pre-order.
New Scanning Electron Microscopy Pin Stubs by PELCO. These new fundamentally improved pin stubs are for correlative, corroborative and repetitive microscopy and repetitive SEM imaging/analysis and specimen preparation. Choose your size from the dropdown menu. 19 x 19mm (3/4" x 3/4")
These holders with pin stub mounts accept standard metallurgical mounts.
(1.25 inch diameter). Available for microscopes using other mounts on request. Choose the size you require from the dropdown menu:
SEM Specimen Stub for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium. (10 pack)
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
A pack of 10 low profile aluminium flat pin stubs which accommodate specimens with small working distances in FIB applications.
These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
A pack of 10 low profile aluminium flat pin stubs which accommodate specimens with small working distances in FIB applications.
SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm. Aluminium.
SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high with M4 thread. Made from Aluminium. Choose your size from the dropdown menu.
SEM Specimen Stub with Al core carbon Tab & Tube supplied in a pack of 10.
Laser etched serialised standard 12.5mm dia aluminium pin stubs with pre-mounted carbon tabs, suitable for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination.(Sold as singles)
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