1. Home/

ATOMIC FORCE MICROSCOPY
PROBES STORE

We offer a huge range of AFM probes. Easily search by mode, application or specification.

SHOP AFM PROBES

Find the Best AFM Probes for Your Research

Polymers
Polymers
Graphene_2D_Materials
Graphene & 2D Materials
Energy_Storage
Energy Storage and Battery Research
Semiconductor_Microelectronics
Semiconductor & Microelectronics
Solar_PV_Thermoelectrics
Solar, Photovoltaics & Thermoelectrics
Quantum_Technology
Quantum Technology
Thin_Films_Coatings
Thin Films & Coatings
Piezo_Ferroelectrics
Piezo & Ferroelectrics
Magnetics_Data_Storage
Magnetics & Data Storage
Bio_Mem_Assem
Biomolecules, Membranes & Assemblies
Cells_Tissues
Cells, Tissues & Hydrogels (super soft cantilevers)
Biomaterials
Biomaterials
Tapping_Mode
Tapping Mode
Contact_Mode
Contact Mode
Video_Rate_AFM_Mode
Video-Rate AFM
Conductive_AFM_Mode
Conductive AFM (CAFM)
Force_Maps_Mode
Force Maps
Force_Curves
Force Curves - Contact
Magnetic_Force_Microscopy_Mode
Magnetic Force Microscopy (MFM)
Scanning_Capacitance_Mode_12
Scanning Capacitance Mode (SCM)
Piezoresponse_Force_Microscopy_Mode
Piezoresponse Force Microscopy
Force_Modulation_Mode
Force Modulation
Kelvin_Probe_Force_Microscopy_Mode
Kelvin Probe Force Microscopy (KPFM)
Electrostatic_Force_Microscopy_Mode
Electrostatic Force Microscopy (EFM)
Fast_Force_Mapping
Fast Force Mapping (FFM)
Fast_Current_Mapping_Mode
Fast Current Mapping
Scanning_Tunneling_Microscopy_Mode
Scanning Tunneling Microscopy (STM)
Contact_Resonance_Viscoelastic_Mapping_Mode
Contact Resonance Viscoelastic Mapping
AM_FM_Viscoelastic_Mapping_Mode
AM-FM Viscoelastic Mapping
Bimodal_Dual_AC_Mode
Bimodal Dual AC
Time_Dependent_Dielectric_Breakdown_Mode
Time Dependent Dielectric Breakdown (TDDB)
Higher_Eigenmode_Tapping_Mode
Higher Eigenmode Tapping
Electrochemical_AFM_Mode
Electrochemical AFM (EC-AFM)
Thermal_Mechanical_Nanoindentation_Mode
Thermal Mechanical Nanoindentation (TMNI)
Scanning_Thermal_Microscopy_Mode
Scanning Thermal Microscopy (SThM)
Electrochemical_Strain_Microscopy_Mode
Electrochemical Strain Microscopy (ESM)
Lateral_Force_Microscopy_Mode
Lateral Force Microscopy (LFM)
Nanolithography_Mode
Nanolithography
Loss_Tangent_Imaging_Mode
Loss Tangent Imaging
Search by Specification
      • 1(1)
      • 3(28)
      • 4(72)
      • concave(4)
      • cone(14)
      • customer(1)
      • plate(1)
      • plateau(8)
      • pyramid(5)
      • rectangle(1)
      • rectangular(38)
      • sided(101)
      • tipless(5)
      • triangular(7)
          • 0.9(2)
          • 2.5(5)
          • 3.0(4)
          • 3.5(4)
          • 6.0(1)
          • 7.0(8)
          • 12.0(1)
          • 12.5(110)
          • 14.0(9)
          • 15.0(3)
          • 17.5(9)
          • 80.0(4)
          • 300.0(3)

            Spring Constant

            • from

              • to

                Frequency

                • from

                  • to