NCL

804.NW.NCL
Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.

Each pack contains 10 probes. 
This product is not in stock but you can order and it will take around two weeks to get delivered.
£ 230.00
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Description

f = 190 kHz   |   k = 48 N/m   |   tip coating: none
Non-contact / Tapping™ mode - Long Cantilever NanoWorld Pointprobe®
NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length ( 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

Details

  • NCL Specifications
  • Frequency (kHz):
    190.0
  • Max Frequency (kHz):
    210.0
  • Min Frequency (kHz):
    160.0
  • Spring Constant (N/m):
    48.0
  • Max Spring Constant (N/m):
    71.0
  • Min Spring Constant (N/m):
    3,123.0
  • Tip Radius (nm):
    8.0
  • Tip Height (um):
    12.5
  • Max Tip Height (um):
    15.0
  • Min Tip Height (um):
    10.0
  • Length, Width, Thickness (µm):
    225 x 38 x 7
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Manufacturer:
    Nanoworld

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