f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
"Magnetic force microscopy - Reflex coating"
NanoWorld Pointprobe® MFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this probe offers unique features:
Typical tip radius of curvature < 50 nm
High magnetic contrast and lateral resolution < 100 nm
electrically conductive coating
Hard Magnetic Coating / Aluminum Reflex Coating
The hard magnetic coating consists of a 40 nm thick cobalt alloy layer deposited on the tip side of the cantilever which leads to a permanent magnetization of the tip with the direction usually along the tip axis. We recommend magnetizing the tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.
The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.
As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees. Soft magnetic samples may be influenced by the tip magnetization!"