PointProbe® Plus XY-alignment Non-Contact / Soft Tapping Mode- Reflex Coating
The XY-auto-alignment probes for Non-Contact / Soft Tapping mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 150 µm short cantilevers optimized for non-contact / soft tapping mode applications.
Probe exchange with a tip repositioning accuracy of better than ± 8 µmis possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.
The probe offers unique features:
guaranteed tip radius of curvature < 10nm
tip height 10 - 15 µm
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
high mechanical Q-factor for high sensitivity
tip repositioning accuracy of better than ± 8 µm (in combination with Align ment Chip)