Model 70-1D with Cert Unmounted
For General Purpose and Metrology Microscopes: A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch.
Surface: Silicon Oxide ridges on Silicon, 4 x 3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated.
This item is on pre-order and will take around 1-2 weeks to arrive.
This item is on pre-order and will take between 1-2 weeks to arrive.
Graphene is a single atomic layer of carbon atoms tightly packed in a two-dimensional honeycomb lattice. This novel material is atomically thin, chemically inert, consists of light atoms, and possesses a highly ordered structure. Graphene is electrically and thermally conductive, and is the strongest material ever measured. These remarkable properties make graphene the ideal support film for electron microscopy.
This item is on pre-order and will take between 1-2 weeks to arrive.
300 mesh, square pattern, 3.05mm diameter TEM grids.
This is a microscope slide marked over the top surface in such a way that a reference position can be deduced by direct reading.
These high quality slides with ground edges have a frosted marking surface available in six colours for easy identification.
This item is on pre-order and will take around 1-2 weeks to arrive.
50 mesh, square pattern, 3.05mm diameter TEM grids. Copper.
Designed by Leica for accurate counting of blood cells platelets, dust/yeast cluster and specimen samples. Sharp contrast from rhodium plated on "V-Load". Triple dividing lines clearly delineate counting area for accurate and precise results.
This item is on pre-order and will take between 1-2 weeks to arrive.
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