Piezo & Ferroelectrics

Piezoresponse force microscopy (PFM) is an atomic force microscopy technique that can be used to characterize the electromechanical coupling underlying the functionality of many material systems, including piezoelectrics, ferroelectrics, and certain biological materials. An electrical stimulus is applied locally to the sample through the AFM tip while the mechanical response, on the order of ~1-100 pm/V, is simultaneously measured.  This technique is relevant to both basic materials science research and a rich field of applied technologies. Asylum Research is recognized as the world leader in commercial PFM technology by providing crosstalk-free, high sensitivity PFM measurements using a variety of advanced and proprietary measurement techniques and capabilities.

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