NCST

804.NW.NCST
Silicon probe with no reflex coating for soft tapping mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
€ 285.00
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Description

f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none
Non-contact / Soft Tapping mode NanoWorld Pointprobe® NCST AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction.

Thus, tip and sample wear could be significantly decreased. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. Additionally, this AFM probe offers a typical tip radius of curvature of less than 8 nm.

Details

  • NCST Specifications
  • Frequency (kHz):
    160.0
  • Spring Constant (N/m):
    7.4
  • Tip Radius (nm):
    8.0
  • Tip Height (um):
    12.5
  • Length, Width, Thickness (µm):
    150 x 27 x 2.8
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Manufacturer:
    Nanoworld

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