Silicon probe with sharp tip for high resolution imaging in force modulation mode.

Each pack contains 10 probes. 
This product is not in stock but you can pre order and it will take around two weeks to get delivered

€ 701.00
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f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none 

SuperSharpSilicon™- Force Modulation Mode - Reflex Coating

NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • Guaranteed tip radius of curvature < 5 nm
  • Typical tip radius of curvature of 2 nm
  • Typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • Half cone angle at 200 nm from apex < 10°
  • Monolithic material
  • Highly doped to dissipate static charge
  • Chemically inert
  • High mechanical Q-factor for high sensitivity


  • SSS-FMR Specifications
  • Frequency (kHz):
  • Spring Constant (N/m):
  • Tip Radius (nm):
  • Tip Height (um):
  • Length, Width, Thickness (µm):
    225 x 30 x 2.8
  • Tip Shape:
    4 sided
  • Tip Material:
  • Tip Coating:
  • Reflective Coating:
  • Manufacturer:

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