PPP-CONTR

804.NS.PPP-CONTR
Silicon probe with Al reflective coating for contact mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
€ 297.00
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Description

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: non
PointProbe® Plus Contact Mode The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.

The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution. NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTR type is optimized for high sensitivity due to a low force constant.

The probe offers unique features: guaranteed tip radius of curvature 10 nm tip height 10 - 15 µm highly doped silicon to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity.


Details

  • PPP-CONTR Specifications
  • Frequency (kHz):
    13.0
  • Spring Constant (N/m):
    0.2
  • Tip Radius (nm):
    7.0
  • Tip Height (um):
    12.5
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Manufacturer:
    Nanosensors

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