Silicon probe with diamond coated tip and long cantilever for tip degrading samples.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.

€ 1,097.00
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f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond
Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

NANOSENSORS™ DT-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non-contact probee (NCH). The NCL type cantilever is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length 125 µm.

Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating.

This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.


  • NS.DT-NCLR Specifications
  • Frequency (kHz):
  • Spring Constant (N/m):
  • Tip Radius (nm):
  • Tip Height (um):
  • Length, Width, Thickness (µm):
    225 x 38 x 7
  • Tip Shape:
    4 sided
  • Tip Material:
  • Tip Coating:
    Doped Diamond
  • Reflective Coating:
  • Manufacturer:

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