Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
€ 1,300.00
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f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond
Conductive Diamond Coated Tip - Non-Contact/Tapping Mode - Long cantilever - Reflex Coating
NANOSENSORS™ CDT-NCLR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to the NANOSENSORS™ high frequency non-contact type (NCH). The CDT-NCLR probe is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length 125 µm.

Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type.

Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is 10 kOhm. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.


  • NS.CDT-NCLR Specifications
  • Frequency (kHz):
  • Spring Constant (N/m):
  • Tip Radius (nm):
  • Tip Height (um):
  • Length, Width, Thickness (µm):
    225 x 38 x 7
  • Tip Shape:
  • Tip Material:
  • Tip Coating:
    Doped Diamond
  • Reflective Coating:
  • Manufacturer:

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