ATEC-FM

804.NS.ATEC-FM
Silicon probe with tip visible at end of lever for force modulation.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
€ 381.00
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Description

f = 85 kHz   |   k = 2.8 N/m   |   tip coating: none
Advanced Tip at the End of the Cantilever™ Force Modulation Mode
NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:
  • real tip visibility from top
  • typical tip radius of curvature better than 10 nm
  • tip height 15 - 20 µm
  • monolithic silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Details

  • ATEC-FM Specifications
  • Frequency (kHz):
    85.0
  • Spring Constant (N/m):
    2.8
  • Tip Radius (nm):
    10.0
  • Tip Height (um):
    17.5
  • Length, Width, Thickness (µm):
    240 x 35 x 3
  • Tip Shape:
    3 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Manufacturer:
    Nanosensors

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