ATEC-CONTAu

804.NS.ATEC-CONTAU
Conductive silicon probe with visible tip apex for contact mode electrical measurements.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
€ 775.00
Pre Order Now

Description

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au
Advanced Tip at the End of the Cantilever™ Contact Mode, Au coated
NANOSENSORS™ AdvancedTEC™ ContAu AFM probes are designed for contact mode imaging.

They feature a tetrahedral tip that protrudes from the very end of the cantilever. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation). Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

Details

  • ATEC-CONTAu Specifications
  • Frequency (kHz):
    15.0
  • Spring Constant (N/m):
    0.2
  • Tip Radius (nm):
    63.0
  • Tip Height (um):
    17.5
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    3 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    Cr/Au
  • Reflective Coating:
    Cr/Au
  • Manufacturer:
    Nanosensors

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