Silicon probe with visible apex tip for force modulation or soft tapping on medium to hard samples.

Each pack contains 10 probes.

€ 275.00

Quantity Discounts

Buy 3-4 items (€ 248.00 each)
Buy 5-9 items (€ 220.00 each)
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In Stock 19


f = 150 kHz   |   k =9 N/m   |   tip coating: none

Medium and Stiffer Middle Silicon Probe (New concept chip) New OLYMPUS OMCL-AC series cantilevers are designed for AC mode AFM in air. OMCL-AC Series has a tetrahedral tip on the exact end of the cantilever.

Outstanding features of new Tetrahedral cantilever:

Application for various sample surfaces:
The mid-range mechanical properties [resonance frequency: 150kHz, spring constant: 9 N/m (typ.)] mean that the OMCL-AC200TS-R3 is tailored to any surface from soft to hard.

Doped silicon cantilever:
The cantilever is made from silicon with a low surface resistance of 0.1 - 0.4 Ω・cm.
This means 1/20 resistance of conventional Olympus cantilevers.

Acclaimed 'TipView' structure:
The probe can be easily positioned at the exact point of your interest. The probe is located at the exact end of the cantilever so that the probe apex is not obscured during optical observations.

Ideally point terminated probe:
The probe is tetrahedral, ideally point terminated. The probe apex 1 micron or more is further sharpened.

New concept chip:
The ideally parallel side-walls of the chip make tweezing easy and eliminate problems with chipping and debris.



  • AC200TS Specifications
  • Frequency (kHz):
  • Spring Constant (N/m):
  • Tip Radius (nm):
  • Tip Height (um):
  • Length, Width, Thickness (µm):
    200 x 40 x 3.5
  • Tip Shape:
    3 sided
  • Tip Material:
  • Tip Coating:
  • Reflective Coating:
  • Manufacturer:

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