PPP-RT-NCHR

804.NS.PPP-RT-NCHR
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
$ 346.00
Pre Order Now

Description

f = 330 kHz   |   k = 42 N/m   |   tip coating: none

PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating 

NANOSENSORS™ PPP-RT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

Details

  • PPP-RT-NCHR Specifications
  • Frequency (kHz):
    330.00
  • Max Frequency (kHz):
    497.00
  • Min Frequency (kHz):
    204.00
  • Spring Constant (N/m):
    42.00
  • Max Spring Constant (N/m):
    130.00
  • Min Spring Constant (N/m):
    1,023.00
  • Tip Radius (nm):
    7.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Length, Width, Thickness (µm):
    125 x 30 x 4
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Manufacturer:
    Nanosensors

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