PPP-RT-FMR

804.NS.PPP-RT-FMR
Silicon probe with rotated tip for force modulation. 75 kHz. 2.8 N/m

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
$ 346.00
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Description

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Details

  • PPP-RT-FMR Specifications
  • Frequency (kHz):
    75.00
  • Max Frequency (kHz):
    115.00
  • Min Frequency (kHz):
    45.00
  • Spring Constant (N/m):
    2.80
  • Max Spring Constant (N/m):
    9.50
  • Min Spring Constant (N/m):
    0.52
  • Tip Radius (nm):
    7.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Length, Width, Thickness (µm):
    225 x 28 x 3
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Manufacturer:
    Nanosensors

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