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The KNT (Kelvin Nanotechnology) scanning thermal microscopy probe is a batch fabricated AFM probe for best in class simultaneous topography and temperature/thermal conductivity mapping. The probe offers excellent flexibility and with a low spring constant Si3N4 cantilever for easy scanning and high resolution.
Sub 100 nm topographic and thermal spatial resolution is readily achieved, with a temperature resolution of 0.1 K.
KNT have been fabricating scanning thermal microscopy probes used by industry and academia for over fifteen years. The KNT-SThM-2an delivers improved mechanical stability and operation over an extended temperature range.