Photovoltaic (PV), thermoelectric (TE), and related materials and devices are developing rapidly and branching into many varying fields, including PV polymers, traditional semiconductor-based PV devices, and now perovskite PV materials. Realizing a future of plentiful, low-cost renewable energy is within reach but requires improved characterization of next-generation photovoltaic (PV) materials. Essential to this effort are the high-resolution imaging capabilities of atomic force microscopy (AFM). Asylum Research atomic force microscopes provide platforms for all the major types of PV materials and devices at every stage of their development, including transparent materials, opaque materials, illumination from the top and bottom, and use of external, user-provided light source. Our electrical characterization suite, combined with our broad platform set, and topped off by our wide array of software and hardware customization tools are unmatched in the AFM industry.