FM

ID 804.NW.FM

Silicon probe with no reflex coating for force modulation mode.

Each pack contains 10 probes.
This product is not in stock but you can order and it will take around two weeks to get delivered.

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Details

$ 307.00

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Description Details

Description

f = 75 kHz | k = 2.8 N/m | tip coating: none

Force Modulation Mode NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging.

The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. Additionally, this probe offers typical tip radius of curvature of less than 8 nm.