FM

804.NW.FM
Silicon probe with no reflex coating for force modulation mode.

Each pack contains 10 probes. 
This product is not in stock but you can order and it will take around two weeks to get delivered.


  • Summer Savings - Buy any 2 AFM Probes and save 10%

$ 307.00
Pre Order Now


Description

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
Force Modulation Mode NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging.

The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

Details

  • FM Specifications
  • Frequency (kHz):
    75.00
  • Max Frequency (kHz):
    90.00
  • Min Frequency (kHz):
    60.00
  • Spring Constant (N/m):
    2.80
  • Max Spring Constant (N/m):
    5.50
  • Min Spring Constant (N/m):
    1.22
  • Tip Radius (nm):
    8.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Length, Width, Thickness (µm):
    225 x 28 x 3
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Manufacturer:
    Nanoworld

Recently Viewed