EFM

804.NW.EFM
Silicon probe with PtIr coating for force modulation.

Each pack contains 10 probes. 
This product is not in stock but you can order and it will take around two weeks to get delivered.

 
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$ 420.00
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Description

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir
Electrostatic Force Microscopy - PtIr5 coating NanoWorld Pointprobe®
EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. The tip radius of curvature is less than 25 nm.

Details

  • EFM Specifications
  • Frequency (kHz):
    75.00
  • Max Frequency (kHz):
    90.00
  • Min Frequency (kHz):
    60.00
  • Spring Constant (N/m):
    2.80
  • Max Spring Constant (N/m):
    5.50
  • Min Spring Constant (N/m):
    1.22
  • Tip Radius (nm):
    25.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Length, Width, Thickness (µm):
    225 x 28 x 3
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    Cr/PtIr
  • Reflective Coating:
    Cr/PtIr
  • Manufacturer:
    Nanoworld

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