CONT

804.NW.CONT
Silicon probe with no reflex coating for contact mode.

Each pack contains 10 probes. 
This product is not in stock but you can order and it will take around two weeks to get delivered.
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$ 307.00
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Description

f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none
Contact Mode NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm. Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

Details

  • CONT Specifications
  • Frequency (kHz):
    13.00
  • Max Frequency (kHz):
    17.00
  • Min Frequency (kHz):
    9.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.40
  • Min Spring Constant (N/m):
    0.07
  • Tip Radius (nm):
    8.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Manufacturer:
    Nanoworld

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