Force Modulation Mode NanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging.
The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe. All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge.
They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm. Additionally, this probe offers a tip radius of curvature of less than 10 nm. The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
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