NANOSENSORS™ PtSi-FM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-FM probes are suitable for C-AFM, Tunneling AFM, Scanning Capacitance Microscopy (SCM), Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KFPM). The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.
The probe offers unique features:
High mechanical Q-factor for high sensitivity
Alignment grooves on backside of silicon holder chip
Precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
Compatible with PointProbe® Plus XY-Alignment Series
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