PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating NANOSENSORS™ PPP-QNCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions.
NANOSENSORS™ PPP-QNCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability. The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius (typical tip radius less than 7 nm) as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.
The probe offers unique features:
guaranteed tip radius of curvature < 10 nm
tip height 10 - 15 µm
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
chemically inert
excellent mechanical Q-factor under UHV conditions for high sensitivity
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