PPP-QFMR

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius (typical tip radius less than 7 nm) as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.

The probe offers unique features:

• guaranteed tip radius of curvature < 10 nm
• tip height 10 - 15 µm
• highly doped silicon to dissipate static charge
• Al coating on detector side of cantilever
• excellent mechanical Q-factor under UHV conditions for high sensitivity
• alignment grooves on backside of silicon holder chip
• precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series