PPP-QFMR

804.NS.PPP-QFMR
High Q silicon probe with Al reflective coating for force modulation in vacuum.

Each bag contains 10 probes.
This product is not in stock but you can order and it will take around two weeks to get delivered.
$ 691.00
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Description

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius (typical tip radius less than 7 nm) as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.

The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • excellent mechanical Q-factor under UHV conditions for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Details

  • PPP-QFMR Specifications
  • Frequency (kHz):
    75.00
  • Max Frequency (kHz):
    115.00
  • Min Frequency (kHz):
    45.00
  • Spring Constant (N/m):
    2.80
  • Max Spring Constant (N/m):
    9.50
  • Min Spring Constant (N/m):
    0.52
  • Tip Radius (nm):
    7.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Length, Width, Thickness (µm):
    225 x 28 x 3
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Manufacturer:
    Nanosensors

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