PointProbe® Plus Contact Mode The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.
The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution. NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTR type is optimized for high sensitivity due to a low force constant.
The probe offers unique features: guaranteed tip radius of curvature 10 nm tip height 10 - 15 µm highly doped silicon to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity.
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