The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images. NANOSENSORS™ PPP-CONTPt AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTPt type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
radius of curvature better than 25 nm
tip height 10 - 15 µm
metallic conductivity of the tip
high mechanical Q-factor for high sensitivity
The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.