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PPP-CONT

804.NS.PPP-CONT
Silicon probe without reflective coating for contact mode.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
  • Summer Savings - Buy any 2 AFM Probes and save 10%

    Details
$ 346.00
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DescriptionDetails

Description

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none
PointProbe® Plus Contact Mode:
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Details

  • PPP-CONT Specifications
  • Frequency (kHz):
    13.00
  • Max Frequency (kHz):
    21.00
  • Min Frequency (kHz):
    6.00
  • Spring Constant (N/m):
    0.20
  • Max Spring Constant (N/m):
    0.77
  • Min Spring Constant (N/m):
    0.02
  • Tip Radius (nm):
    7.00
  • Tip Height (um):
    12.50
  • Max Tip Height (um):
    15.00
  • Min Tip Height (um):
    10.00
  • Length, Width, Thickness (µm):
    450 x 50 x 2
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    None
  • Manufacturer:
    Nanosensors

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