PL2-NCLR

804.NS.PL2-NCLR
Silicon probe with plateau tip with Al reflex coating. These probes are on the “special development” list and as such the specifications are not guaranteed and/or subject to change, pricing may fluctuate and delivery times may be longer than usual. Please contact us directly if you would like to order these probes. 

Each pack contains 10 probes.
$ 890.00
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Description

f = 190 kHz   |   k = 48 N/m   |   tip coating: none
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating
NANOSENSORS™ PL2-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode).

The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PL2-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm.

Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.


Details

  • PL2-NCLR Specifications
  • Frequency (kHz):
    190.00
  • Spring Constant (N/m):
    48.00
  • Max Spring Constant (N/m):
    98.00
  • Min Spring Constant (N/m):
    2,123.00
  • Tip Radius (nm):
    900.00
  • Length, Width, Thickness (µm):
    225 x 38 x 7
  • Tip Shape:
    Plateau
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    AI
  • Manufacturer:
    Nanosensors

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