Silicon probe with plateau tip for force modulation. These probes are on the “special development” list and as such the specifications are not guaranteed and/or subject to change, pricing may fluctuate and delivery times may be longer than usual. Please contact us directly if you would like to order these probes.
Each pack contains 10 probes.
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The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
The PL2-FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.