Advanced Tip at the End of the Cantilever™ Force Modulation Mode
NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.