Advanced Tip at the End of the Cantilever™ Contact Mode
NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation). Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.